X-ray Photoelectron Spectroscopy (XPS)
X-ray photoelectron spectroscopy (XPS) measures the kinetic energy of photoemitted electrons to determine elemental composition, oxidation state, and chemical environment within the top few nanometers of a sample. R&D scientists use it to characterize surfaces and interfaces in catalysts, semiconductors, coatings, and battery materials, with depth profiling enabled by sputtering. Strong practitioners balance ultra-high-vacuum sample handling, careful peak fitting, and charge-correction discipline to produce quantitatively credible results.
