Scanning Probe Microscopy (SPM)
Scanning probe microscopy (SPM) — encompassing atomic force microscopy (AFM), scanning tunneling microscopy (STM), and related modes — maps surface topography, mechanical properties, conductivity, and electrochemical reactivity at nanometer to atomic resolution by raster-scanning a sharp probe across a surface. As a hard skill it requires selecting the AFM operating mode (contact, tapping, PeakForce, KPFM, EC-AFM) for the property of interest, optimizing tip selection and scan parameters, and interpreting image artifacts from tip convolution and sample drift. Battery researchers apply SPM to image SEI formation in situ, measure electrode roughening and volume changes during lithiation, and map local conductivity and potential on composite electrode surfaces.
