Scanning Electron Microscopy (SEM)
Scanning electron microscopy (SEM) rasters a focused electron beam across a sample surface and collects secondary or backscattered electrons to form high-resolution images of morphology, topography, and phase contrast at nanometer to micron scale. As a hard skill it requires preparing conductive, vacuum-stable specimens (sputter coating for non-conductors), selecting the correct accelerating voltage and working distance, and interpreting contrast from secondary-electron topography versus backscattered-electron compositional signals. Battery researchers apply SEM to characterize cathode particle morphology, examine electrode cross-sections for crack and delamination patterns, image dendrite morphology on cycled lithium anodes, and guide post-mortem failure analysis.
